Local probing of the polarization state in thin Pb(ZrTi)O3 films during polarization reversal

被引：17
|
作者：
Mishina, ED [1 ]
Sherstyuk, NE
Pevtsov, EP
Vorotilov, KA
Sigov, AS
Moret, MP
Rössinger, SA
Larsen, PK
Rasing, T
机构：
[1] Moscow Inst Radio Engn Elect & Automat, Moscow 117454, Russia
[2] Univ Nijmegen, Mat Res Inst, NL-6525 ED Nijmegen, Netherlands
来源：
APPLIED PHYSICS LETTERS | 2001年 / 78卷 / 06期
关键词：
D O I：
10.1063/1.1329332
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The polarization state of a thin Pb(ZrTi)O-3 film is probed by optical second-harmonic generation (SHG) while applying an external voltage (a sine wave). A hysteresis in the SHG intensity is observed that corresponds to the dielectric hysteresis and is analyzed using a phenomenological relation between the SHG intensity and the dielectric polarization. Based on this model, the polarization state of the film during polarization reversal is mapped. (C) 2001 American Institute of Physics.
引用
收藏
页码：796 / 798
页数：3
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