Epitaxial stabilization of SmNiO3 films on (001) SrTiO3 substrates

被引：14

作者：

Conchon, F.

Boulle, A.

Girardot, C.

Pignard, S.

Guinebretiere, R.

Dooryhee, E.

Hodeau, J-L

Weiss, F.

Kreisel, J.

Berar, J-F

机构：

[1] ENSCI, Lab Sci Procedes Ceram & Traitements Surfaces SPC, CNRS, UMR 6638, F-87065 Limoges, France

[2] INP Grenoble, MINATEC, LMGP, CNRS UMR 5628, F-38016 Grenoble, France

[3] CNRS, UPR 2940, Inst Neel IN, F-38042 Grenoble, France

来源：

JOURNAL OF PHYSICS D-APPLIED PHYSICS | 2007年 / 40卷 / 16期

关键词：

D O I：

10.1088/0022-3727/40/16/017

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The epitaxial stabilization of SmNiO3 (SNO) films grown by an injection MO-CVD process on ( 0 0 1) SrTiO3 (STO) substrates is discussed. By means of high-resolution x-ray diffraction, we show for the first time that SNO can be stabilized on STO with a minor amount of secondary phases and with a layer thickness reaching several hundreds of nanometres. It is argued that this stabilization is achieved because the lattice mismatch between these two perovskites is not as high as expected (1.8% instead of 2.8%). Moreover, the well-known dissociation of the SNO phase into NiO and Sm2O3 has been clearly correlated with the relaxation of epitaxial strain which is driven by the formation of misfit dislocations.

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收藏

页码：4872 / 4876

页数：5

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