First overtone frequency stimulated quartz tuning fork used for shear-force scanning near-field optical microscopy

被引：0
作者：
Liu, S
Sun, JL [1 ]
Sun, HS
Tan, XJ
Shi, S
Guo, JH
Zhao, J
机构：
[1] Tsing Hua Univ, Key Lab Atom & Mol Nanosci, Educ Minist, Beijing 100084, Peoples R China
[2] Tsing Hua Univ, Dept Phys, Beijing 100084, Peoples R China
[3] Tsing Hua Univ, CAAD Lab, Beijing 100084, Peoples R China
来源：
CHINESE PHYSICS LETTERS | 2003年 / 20卷 / 11期
关键词：
SAMPLE DISTANCE CONTROL;
D O I：
暂无
中图分类号：
O4 [物理学];
学科分类号：
0702 ;
摘要：
The conventional 32.768 kHz tuning fork is stimulated at its first overtone resonant frequency of similar to190 kHz for shear-force distance control. The time constant is measured to be 0.54 ms and it decreases about 40 times faster than that of the fundamental frequency (20.76 ms). The cross section of a corn root with a height difference of similar to 3 mum is imaged at a scan speed of 12 mum/s for 256 x 256 pixels.
引用
收藏
页码：1928 / 1931
页数：4
相关论文
共 10 条
  • [1] A phase-locked shear-force microscope for distance regulation in near-field optical microscopy
    Atia, WA
    Davis, CC
    [J]. APPLIED PHYSICS LETTERS, 1997, 70 (04) : 405 - 407
  • [2] High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork
    Giessibl, FJ
    [J]. APPLIED PHYSICS LETTERS, 1998, 73 (26) : 3956 - 3958
  • [3] KANBAYASHI S, 1976, P AFCS JAN 1976 WASH
  • [4] Method for increasing sensitivity of shear-force distance control for scanning near-field microscopy
    Kantor, R
    Lesnak, M
    Berdunov, N
    Shvets, IV
    [J]. APPLIED SURFACE SCIENCE, 1999, 144-45 : 510 - 513
  • [5] Piezo-electric tuning fork tip-sample distance control for near field optical microscopes
    Karrai, K
    Grober, RD
    [J]. ULTRAMICROSCOPY, 1995, 61 (1-4) : 197 - 205
  • [6] PIEZOELECTRIC TIP-SAMPLE DISTANCE CONTROL FOR NEAR-FIELD OPTICAL MICROSCOPES
    KARRAI, K
    GROBER, RD
    [J]. APPLIED PHYSICS LETTERS, 1995, 66 (14) : 1842 - 1844
  • [7] Tuning fork shear-force feedback
    Ruiter, AGT
    van der Werf, KO
    Veerman, JA
    Garcia-Parajo, MF
    Rensen, WHJ
    van Hulst, NF
    [J]. ULTRAMICROSCOPY, 1998, 71 (1-4) : 149 - 157
  • [8] Fast-scanning shear-force microscopy using a high-frequency dithering probe
    Seo, Y
    Park, JH
    Moon, JB
    Jhe, W
    [J]. APPLIED PHYSICS LETTERS, 2000, 77 (26) : 4274 - 4276
  • [9] Shear-force distance control at megahertz frequencies for near-field scanning optical microscopy
    Simon, A
    Brunner, R
    White, JO
    Hollricher, O
    Marti, O
    [J]. REVIEW OF SCIENTIFIC INSTRUMENTS, 2001, 72 (11) : 4178 - 4182
  • [10] Tan XJ, 2003, CHINESE PHYS LETT, V20, P338, DOI 10.1088/0256-307X/20/3/307
1