Progress in the development of Mo/Au transition-edge sensors for x-ray spectroscopy

被引:15
作者
Stahle, CK [1 ]
Brekosky, RP [1 ]
Figueroa-Feliciano, E [1 ]
Finkbeiner, FM [1 ]
Gygax, JD [1 ]
Li, MJ [1 ]
Lindeman, MA [1 ]
Porter, FS [1 ]
Tralshawala, N [1 ]
机构
[1] NASA, Goddard Space Flight Ctr, Greenbelt, MD 20771 USA
来源
X-RAY AND GAMMA-RAY INSTRUMENTATION FOR ASTRONOMY XI | 2000年 / 4140卷
关键词
microcalorimeter; x-ray spectroscopy; imaging spectrometer;
D O I
10.1117/12.409131
中图分类号
P1 [天文学];
学科分类号
0704 ;
摘要
X-ray microcalorimeters using transition-edge sensors (TES) show great promise for use in astronomical x-ray spectroscopy. We have obtained very high energy resolution (2.8 eV at 1.5 keV and 3.7 eV at 3.3 keV) in a large, isolated TES pixel using a Mo/Au proximity-effect bilayer on a silicon nitride membrane. We will discuss the performance and our characterization of that device. In order to be truly suitable for use behind an x-ray telescope, however, such devices need to be arrayed with a pixel size and focal-plane coverage commensurate with the telescope focal length and spatial resolution. Since this requires fitting the TES and its thermal link, a critical component of each calorimeter pixel, into a far more compact geometry than has previously been investigated, we must study the fundamental scaling laws in pixel optimization. We have designed a photolithography mask that will allow us to probe the range in thermal conductance that can be obtained by perforating the nitride membrane in a narrow perimeter around the sensor. This mask will also show the effects of reducing the TES area. Though we have not yet tested devices of the compact designs, we will present our progress in several of the key processing steps and discuss the parameter space of our intended investigations.
引用
收藏
页码:367 / 375
页数:9
相关论文
共 17 条
[1]   DIAGRAM AND NONDIAGRAM LINES IN K SPECTRA OF ALUMINUM AND OXYGEN FROM METALLIC AND ANODIZED ALUMINUM [J].
FISCHER, DW ;
BAUN, WL .
JOURNAL OF APPLIED PHYSICS, 1965, 36 (02) :534-&
[2]  
Hansen M., 1958, CONSTITUTION BINARY, DOI DOI 10.1149/1.2428700
[3]   Measurements of thermal transport in low stress silicon nitride films [J].
Holmes, W ;
Gildemeister, JM ;
Richards, PL ;
Kotsubo, V .
APPLIED PHYSICS LETTERS, 1998, 72 (18) :2250-2252
[4]  
IRWIN K, COMMUNICATION
[5]   AN APPLICATION OF ELECTROTHERMAL FEEDBACK FOR HIGH-RESOLUTION CRYOGENIC PARTICLE-DETECTION [J].
IRWIN, KD .
APPLIED PHYSICS LETTERS, 1995, 66 (15) :1998-2000
[6]   Thermal-response time of superconducting transition-edge microcalorimeters [J].
Irwin, KD ;
Hilton, GC ;
Wollman, DA ;
Martinis, JM .
JOURNAL OF APPLIED PHYSICS, 1998, 83 (08) :3978-3985
[7]   NATURAL WIDTHS OF ATOMIC K-LEVELS AND L-LEVELS,K-ALPHA X-RAY-LINES AND SEVERAL KLL AUGER LINES [J].
KRAUSE, MO ;
OLIVER, JH .
JOURNAL OF PHYSICAL AND CHEMICAL REFERENCE DATA, 1979, 8 (02) :329-338
[8]   WIDTHS AND ASYMMETRIES OF K-ALPHA-1 AND KALPHA-2 X-RAY LINES AND L2 AND L3 FLUORESCENCE YIELDS OF TRANSITION-ELEMENTS [J].
LEE, PL ;
SALEM, SI .
PHYSICAL REVIEW A, 1974, 10 (06) :2027-2032
[9]   Thermal characteristics of silicon nitride membranes at sub-Kelvin temperatures [J].
Leivo, MM ;
Pekola, JP .
APPLIED PHYSICS LETTERS, 1998, 72 (11) :1305-1307
[10]   Composite infrared bolometers with Si3N4 micromesh absorbers [J].
Mauskopf, PD ;
Bock, JJ ;
DelCastillo, H ;
Holzapfel, WL ;
Lange, AE .
APPLIED OPTICS, 1997, 36 (04) :765-771