Graphene at High Bias: Cracking, Layer by Layer Sublimation, and Fusing

被引:94
作者
Barreiro, A. [1 ]
Boerrnert, F. [2 ]
Ruemmeli, M. H. [2 ,3 ]
Buechner, B. [2 ]
Vandersypen, L. M. K. [1 ]
机构
[1] Delft Univ Technol, Kavli Inst Nanosci, NL-2628 CJ Delft, Netherlands
[2] IFW Dresden, D-01171 Dresden, Germany
[3] Tech Univ Dresden, D-01069 Dresden, Germany
关键词
Graphene; transmission electron microscopy; nanostructuring nanosculpting; in situ Joule heating; SUSPENDED GRAPHENE; CARBON NANOTUBES; TRANSFORMATIONS;
D O I
10.1021/nl204236u
中图分类号
O6 [化学];
学科分类号
0703 ;
摘要
Graphene and few-layer graphene at high bias expose a wealth of phenomena due to the high temperatures reached. With in situ transmission electron microscopy, we observe directly how the current modifies the structure, and vice versa. In some samples, cracks propagate from the edges of the flakes, leading to the formation of narrow constrictions or to nanometer spaced gaps after breakdown. In other samples, we find layer-by-layer evaporation of few-layer graphene, which could be exploited for the controlled production of single layer graphene from multilayered samples. Surprisingly, we even find that two pieces of graphene that overlap can heal out at high bias and form one continuous sheet. These findings open up new avenues to structure graphene for specific device applications.
引用
收藏
页码:1873 / 1878
页数:6
相关论文
共 24 条
[1]   Graphene: Electronic and Photonic Properties and Devices [J].
Avouris, Phaedon .
NANO LETTERS, 2010, 10 (11) :4285-4294
[2]  
Barreiro A., ARXIV12013131
[3]   Ultrahigh electron mobility in suspended graphene [J].
Bolotin, K. I. ;
Sikes, K. J. ;
Jiang, Z. ;
Klima, M. ;
Fudenberg, G. ;
Hone, J. ;
Kim, P. ;
Stormer, H. L. .
SOLID STATE COMMUNICATIONS, 2008, 146 (9-10) :351-355
[4]   Geometrical dependence of high-bias current in multiwalled carbon nanotubes -: art. no. 026804 [J].
Bourlon, B ;
Glattli, DC ;
Plaçais, B ;
Berroir, JM ;
Miko, C ;
Forró, L ;
Bachtold, A .
PHYSICAL REVIEW LETTERS, 2004, 92 (02) :4
[5]   Energy band-gap engineering of graphene nanoribbons [J].
Han, Melinda Y. ;
Oezyilmaz, Barbaros ;
Zhang, Yuanbo ;
Kim, Philip .
PHYSICAL REVIEW LETTERS, 2007, 98 (20)
[6]   Scaling properties and electromigration resistance of sputtered Ag metallization lines [J].
Hauder, M ;
Gstöttner, J ;
Hansch, W ;
Schmitt-Landsiedel, D .
APPLIED PHYSICS LETTERS, 2001, 78 (06) :838-840
[7]   In Situ Imaging of Layer-by-Layer Sublimation of Suspended Graphene [J].
Huang, Jian Yu ;
Qi, Liang ;
Li, Ju .
NANO RESEARCH, 2010, 3 (01) :43-50
[8]   In situ observation of graphene sublimation and multi-layer edge reconstructions [J].
Huang, Jian Yu ;
Ding, Feng ;
Yakobson, Boris I. ;
Lu, Ping ;
Qi, Liang ;
Li, Ju .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2009, 106 (25) :10103-10108
[9]   High-field quasiballistic transport in short carbon nanotubes [J].
Javey, A ;
Guo, J ;
Paulsson, M ;
Wang, Q ;
Mann, D ;
Lundstrom, M ;
Dai, HJ .
PHYSICAL REVIEW LETTERS, 2004, 92 (10) :106804-1
[10]   Open and Closed Edges of Graphene Layers [J].
Liu, Zheng ;
Suenaga, Kazu ;
Harris, Peter J. F. ;
Iijima, Sumio .
PHYSICAL REVIEW LETTERS, 2009, 102 (01)