Data mining applied for analysis of fault sequences in electronic circuits

In electronics industries, more precisely in the UPS (Uninterruptable Power Supply) industry, there is a challenge to discover an optimized testing sequence for electronic cards. If a fault occurs in a test, the procedure is to repair the electronic card immediately; however the test may depend on previous tests that should be repeated. The situation could be time consuming if a fault occurs at the end of a testing sequence. In some cases, the whole testing sequence might have to be repeated. The optimized testing sequence is obtained by discovering test patterns and bringing them to the beginning of the sequence. The purpose of this paper is to develop an optimized testing sequence method reducing fault detection time by using a structure capable of finding test patterns that often occur in a database. This paper uses the KDD (Knowledge Discovery in Databases) methodology for data preparation and application of data mining techniques. Data mining techniques are used to discover test patterns to optimize future testing sequences. The project focuses on data mining applications.