Electrostatic force microscopy of electronic transport in carbon nanotubes

被引：0
|
作者：
Bachtold, A [1 ]
Fuhrer, MS [1 ]
McEuen, PL [1 ]
机构：
[1] Delft Univ Technol, Dept Appl Phys, NL-2628 CJ Delft, Netherlands
来源：
Electronic Correlations: From Meso- to Nano-Physics | 2001年
关键词：
D O I：
暂无
中图分类号：
O469 [凝聚态物理学];
学科分类号：
070205 ;
摘要：
We use electrostatic force microscopy to probe the conducting properties of carbon nanotubes at room temperature. Multiwalled carbon nanotubes are shown to be diffusive conductors, while metallic single-walled carbon nanotubes are ballistic conductors over micron lengths.
引用
收藏
页码：427 / 431
页数：5
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