Effect of Spectral Power Distribution on the Resolution Enhancement in Surface Plasmon Resonance

被引：4

作者：

Zhou, Cuixia ^{[1
]}

Xia, Guo ^{[1
]}

Wang, Guodong ^{[1
]}

Jin, Shiqun ^{[1
]}

机构：

[1] Hefei Univ Technol, Natl Key Lab Adv Display Technol, Natl Engn Lab Special Display Technol,Minist Educ, Acad Photoelect Technol,Lab Special Display Techn, Hefei 230009, Anhui, Peoples R China

来源：

PHOTONIC SENSORS | 2018年 / 8卷 / 04期

关键词：

Instrumentation; measurement; metrology; surface plasmon; resonance; SENSORS; BIOSENSOR; GRAPHENE; COMPACT;

D O I：

10.1007/s13320-018-0507-8

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

For wavelength interrogation based surface plasmon resonance (SPR) sensors, refractive index (RI) resolution is an important parameter to evaluate the performance of the system. In this paper, we explore the influence of spectral power distribution on the refractive index (RI) resolution of the SPR system by simulating the reflectivity curve corresponding to the different incident angles of the classical Kretschmann structure and several different spectral power distribution curves. A wavelength interrogation based SPR system is built, and commercial micro-spectrometers (USB2000 and USB4000) are used as the detection components, respectively. The RI resolutions of the SPR system in these two cases are measured, respectively. Both theoretical and experimental results show that the spectral power distribution has a significant effect on the RI resolution of the SPR system.

引用

页码：310 / 319

页数：10

共 15 条

[1] On the sensitivity of surface plasmon resonance sensors with spectral interrogation [J].