Low-temperature photoemission study of the surface electronic structure of Si(111)7x7

被引:78
|
作者
Uhrberg, RIG [1 ]
Kaurila, T
Chao, YC
机构
[1] Linkoping Univ, Dept Phys & Measurement Technol, S-58183 Linkoping, Sweden
[2] Turku Univ, Dept Appl Phys, Turku 20014, Finland
关键词
D O I
10.1103/PhysRevB.58.R1730
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The electronic structure of the Si(111)7 x 7 surface has been studied in detail at a sample temperature of 55 K with high-energy-resolution angle-resolved photoemission. The photoemission spectra show a previously undetected surface-state structure at approximate to 0.5 eV below the Fermi level that we assign to dangling-bend states located mainly to the adatoms near the corner holes of the 7x7 reconstruction. Detailed dispersion curves obtained at 55 K are presented for the three uppermost, dangling-bond derived, surface states. Surface sensitive Si 2p spectra obtained in this low-temperature study still show a comparatively broad line shape. Possible reasons for this are discussed.
引用
收藏
页码:R1730 / R1733
页数:4
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