Complex Permittivity Measurement System for Solid Materials Using Complementary Frequency Selective Surfaces

被引：8

作者：

Lee, Chih-Kuo ^{[1
]}

Zhang, Shiyu ^{[1
]}

Bukhari, Syed Sheheryar ^{[2
]}

Cadman, Darren ^{[1
]}

Vardaxoglou, J. C. ^{[1
]}

Whittow, William G. ^{[1
]}

机构：

[1] Loughborough Univ, Wolfson Sch Mech Elect & Mfg Engn, Loughborough LE11 3TU, Leics, England

[2] Univ Oxford, Dept Mat, Oxford OX1 2JD, England

来源：

IEEE ACCESS | 2020年 / 8卷 / 7628-7640期

基金：

英国工程与自然科学研究理事会;

关键词：

Dielectric losses; dielectric measurement; frequency selective surfaces; permittivity; FREE-SPACE; MICROWAVE;

D O I：

10.1109/ACCESS.2020.2963919

中图分类号：

TP [自动化技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper describes a novel method of characterizing complex permittivity using a complementary frequency selective surface (CFSS). The CFSS provides a passband behavior and the change in the passband when a material under test (MUT) is placed adjacent to the CFSS has been used for retrieving of the complex permittivity of the MUT. The complex permittivity of the MUT are determined based on the measured bandpass resonant frequency and insertion loss of the CFSS with the MUT. This is an amplitude-only method where phase measurements are not required. This technique offers a convenient, fast, low-cost and nondestructive measurement that is not restricted by the sample size or shape.

引用

页码：7628 / 7640

页数：13

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