Device Architecture for Terahertz Characterization of Organic Electro-optic Ultra-thin Films using Time-Domain Attenuated Total Reflection Method

被引：0
作者：
Jin, Wenwei [1 ]
Xu, Ruimin [1 ]
机构：
[1] Univ Elect Sci & Technol China, EHF Key Lab Fundamental Sci, Chengdu 611731, Peoples R China
来源：
2015 IEEE INTERNATIONAL CONFERENCE ON COMMUNICATION PROBLEM-SOLVING (ICCP) | 2015年
关键词：
SPECTROSCOPY;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
We developed a new device architecture for characterizing the properties of electro-optic (EO) material from the thin-film device utilizing time-domain attenuated total reflection spectroscopy in the terahertz (THz) frequency region. The properties of the test material showed good agreement with the results from pellets measurements by conventional THz-TDS system.
引用
收藏
页码：563 / 564
页数：2
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