Apparatus for X-ray diffraction microscopy and tomography of cryo specimens

被引：22

作者：

Beetz, T ^{[1
]}

Howells, MR

Jacobsen, C

Kao, CC

Kirz, J

Lima, E

Mentes, TO

Miao, H

Sanchez-Hanke, C

Sayre, D

Shapiro, D

机构：

[1] Brookhaven Natl Lab, Ctr Funct Nanomat, Upton, NY 11973 USA

[2] SUNY Stony Brook, Dept Phys & Astron, Stony Brook, NY 11794 USA

[3] Lawrence Berkeley Natl Lab, Adv Light Source, Berkeley, CA 94720 USA

[4] Brookhaven Natl Lab, Natl Synchrotron Light Source, Upton, NY 11973 USA

[5] INFM, TASC, Natl Lab, I-34012 Trieste, Italy

来源：

NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT | 2005年 / 545卷 / 1-2期

基金：

美国国家科学基金会; 美国国家卫生研究院;

关键词：

X-ray microscopy; X-ray imaging; X-ray tomography; diffraction microscopy; lensless imaging;

D O I：

10.1016/j.nima.2004.12.040

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An apparatus for diffraction microscopy of biological and materials science specimens is described. In this system, a coherent soft X-ray beam is selected with a pinhole, and the illuminated specimen is followed by an adjustable beamstop and CCD camera to record diffraction data from non-crystalline specimens. In addition, a Fresnel zone plate can be inserted to allow for direct imaging. The system makes use of a cryogenic specimen holder with cryotransfer capabilities to allow frozen hydrated specimens to be loaded. The specimen can be tilted over a range of +/- 80 degrees for three-dimensional imaging; this is done by computer-controlled motors, enabling automated alignment of the specimen through a tilt series. The system is now in use for experiments in soft X-ray diffraction microscopy. (c) 2005 Elsevier B.V. All rights reserved.

引用

页码：459 / 468

页数：10

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