External reference samples for residual stress analysis by X-ray diffraction

被引:4
作者
Lefebvre, F. [1 ]
Francois, M. [2 ]
Cacot, J. [3 ]
Hemery, C. [20 ]
Le-bec, P. [5 ]
Baumhauer, E. [4 ]
Bouscaud, D. [6 ]
Bergey, T. [7 ]
Blaize, D. [7 ]
Gloaguen, D. [8 ]
Lebrun, J. L. [6 ]
Cosson, A. [9 ]
Kubler, R. [6 ]
Cheynet, Y. [10 ]
Daniel, E. [12 ]
Michaud, H. [11 ]
Monvoisin, J. C. [7 ]
Blanchet, P. [13 ]
Allain, P. [13 ]
Mrini, Y. [14 ]
Sprauel, J. M. [15 ]
Goudeau, P. [16 ]
Barbarin, P. [1 ]
Charles, C. [1 ]
Le Roux, J. M. [1 ]
Seiler, W. [6 ]
Fischer, C. [6 ]
Desmas, L. [17 ]
Ouakka, A. [18 ]
Moya, M. J. [8 ]
Bordiec, Y. [19 ]
机构
[1] CETIM, 52 Ave Felix Louat, F-60304 Senlis, France
[2] LASMIS, F-10010 Troyes, France
[3] Global Res & Dev, F-57360 Amneville, France
[4] PSA Ctr tech Belcham, F-25218 Montbeliard, France
[5] EDF, R&D Dept MMC, London, England
[6] Arts Metiers ParisTech, Paris, France
[7] Safran, Paris, France
[8] Boulevard univ, F-44602 Dijon, France
[9] SKF, Lab GTD 204, S-37540 Gothenburg, Sweden
[10] SNCF, F-94407 St Etienne, France
[11] Ascometal, F-57301 Arles, France
[12] Metal Improvement Com, Romulus, MI USA
[13] DCNS, F-44620 Paris, France
[14] RENAULT, F-78288 Boulogne, France
[15] Univ Mediterranee, F-13625 Marseille, France
[16] Inst Pprime, Poitiers, France
[17] MELIAD, F-4480 LesSorinieres, France
[18] ALLEVARD REJNA AUTOSUSPENSIONS, F-59500 DOUAI, France
[19] SONATS, F-44475 CARQUEFOU, France
[20] SAS CIPRES, F-25005 BESANCON, France
来源
RESIDUAL STRESSES VIII | 2011年 / 681卷
关键词
Residual stress; External reference samples; ROUND-ROBIN TEST;
D O I
10.4028/www.scientific.net/MSF.681.215
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
The GFAC (French Association for residual stress analysis) decided in 2007 to work on external reference samples for residual stress analysis by X-ray diffraction as defined in the XPA 09-285 and EN 15305-2009 standards. Seven materials are studied: ferritic steel, martensitic steel, aluminium alloy, titanium alloy, 2 types of Nickel-Chromium alloy and tungsten thin layers deposited on silicon wafers. The purpose of this external round robin campaign is threefold: (i) to give possibilities for each laboratory involved in the campaign test to obtain external reference samples for each material tested, (ii) to validate a common procedure for qualification of external samples and (iii) to commercialise validated external reference samples through the GFAC association. A common approach of X-Ray diffraction parameters, samples geometry and standard procedure has been chosen and adopted by each laboratory involved in these tests. No indication in terms of residual stress calculation method is given; the choice of the method (centroid, middle point, maximum of peak, fitting...) is the choice of the laboratory according to their X-ray diffraction setups, softwares and experience. Once all samples are analysed, values given by each laboratory are compared and analysed.
引用
收藏
页码:215 / +
页数:3
相关论文
共 16 条
[1]  
A Marschal, 1982, B BNM, V50, P65
[2]  
[Anonymous], EN153052009
[3]  
[Anonymous], 1993, 57251993 ISO
[4]   REPORT ON SYMPOSIUM ON AN INTERNATIONAL STANDARD REFERENCE MATERIALS PROGRAM [J].
ASTIN, AV .
METROLOGIA, 1970, 6 (01) :33-&
[5]   Round-robin test for X-ray stress analysis standards:: optimization for discrepancy reduction [J].
Ferreira, C. ;
Francois, M. ;
Guillen, R. .
JOURNAL OF STRAIN ANALYSIS FOR ENGINEERING DESIGN, 2008, 43 (01) :67-74
[6]  
Flaman M. T., 1986, Experimental Techniques, V10, P23, DOI 10.1111/j.1747-1567.1986.tb00935.x
[7]   French round-robin test of X-ray stress determination on a shot-peened steel [J].
Francois, M ;
Convert, F ;
Branchu, S .
EXPERIMENTAL MECHANICS, 2000, 40 (04) :361-368
[8]   Reference specimens for x-ray stress analysis:: the French experience [J].
François, M ;
Ferreira, C ;
Botzon, R .
METROLOGIA, 2004, 41 (01) :33-40
[9]  
Francois M., ECHANTILLONS REFEREN
[10]   Round robin test on the determination of residual stress depth distributions by X-ray diffraction [J].
Gibmeier, J ;
Lu, J ;
Scholtes, B .
ECRS 6: PROCEEDINGS OF THE 6TH EUROPEAN CONFERENCE ON RESIDUAL STRESSES, 2002, 404-7 :659-664