Multilayer piezoelectric stack actuator characterization

被引:20
作者
Sherrit, Stewart [1 ]
Jones, Christopher M. [1 ]
Aldrich, Jack B. [1 ]
Blodget, Chad [1 ]
Bao, Xiaoqi [1 ]
Badescu, Mircea [1 ]
Bar-Cohen, Yoseph [1 ]
机构
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91125 USA
来源
BEHAVIOR AND MECHANICS OF MULTIFUNCTIONAL AND COMPOSITE MATERIALS 2008 | 2008年 / 6929卷
关键词
piezoelectric devices; positioners; active mirrors; stacks; multilayers;
D O I
10.1117/12.776396
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Future NASA missions are increasingly seeking to use actuators for precision positioning to accuracies of the order of fractions of a nanometer. For this purpose, multilayer piezoelectric stacks are being considered as actuators for driving these precision mechanisms. In this study, sets of commercial PZT stacks were tested in various AC and DC conditions at both nominal and extreme temperatures and voltages. AC signal testing included impedance, capacitance and dielectric loss factor of each actuator as a function of the small-signal driving sinusoidal frequency, and the ambient temperature. DC signal testing includes leakage current and displacement as a function of the applied DC voltage. The applied DC voltage was increased to over eight times the manufacturers' specifications to investigate the correlation between leakage current and breakdown voltage. Resonance characterization as a function of temperature was done over a temperature range of -180 degrees C to + 200 degrees C which generally exceeded the manufacturers' specifications. In order to study the lifetime performance of these stacks, five actuators from one manufacturer were driven by a 60volt, 2 kHz sine-wave for ten billion cycles. The tests were performed using a Lab-View controlled automated data acquisition system that monitored the waveform of the stack electrical current and voltage. The measurements included the displacement, impedance, capacitance and leakage current and the analysis of the experimental results will be presented.
引用
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页数:12
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