Controlling of electronic parameters of GaAs Schottky diode by poly(3,4-ethylenedioxithiophene)-block-poly(ethylene glycol) organic interlayer

被引:17
作者
Aydin, Mehmet Enver [2 ]
Soylu, Murat [3 ]
Yakuphanoglu, Fahrettin [1 ,3 ]
Farooq, W. A. [4 ]
机构
[1] Firat Univ, Dept Met & Mat Engn, TR-23169 Elazig, Turkey
[2] Dicle Univ, Fac Sci & Arts, Dept Phys, Diyarbakir, Turkey
[3] Bingol Univ, Fac Sci & Arts, Dept Phys, Bingol, Turkey
[4] King Saud Univ, Coll Sci, Dept Phys, Riyadh 11451, Saudi Arabia
关键词
Organic semiconductor/inorganic; semiconductor contacts; Hetero-junction; Schottky barrier diodes; INTERFACE STATE DENSITY; BARRIER HEIGHT; ELECTRICAL CHARACTERIZATION; SI; METAL; CONTACT; PHTHALOCYANINE; SURFACES;
D O I
10.1016/j.mee.2010.11.012
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The electronic properties of metal-organic semiconductor-inorganic semiconductor structure between GaAs and poly(3,4-ethylenedioxithiophene)-block-poly(ethylene glycol) organic film have been investigated via current-voltage and capacitance-voltage methods. The Au/PEDOT/n-GaAs contact exhibits a rectification behavior with the barrier height of 0.69 eV and ideality factor value of 3.94. The barrier height of the studied diode (0.67 eV) is lower than that of Ni/n-GaAs/In (0.85 eV) and Au/n-GaAs/In Schottky diodes. The decrease in barrier height of Au/n-GaAs/In Schottky diode is likely to be due to the variation in the space charge region in the GaAs. The obtained results indicate that control of the interfacial potential barrier for metal/n-GaAs diode was achieved using thin interlayer of the poly(3,4-ethylenedioxithiophene)-block-poly(ethylene glycol). (c) 2010 Elsevier B.V. All rights reserved.
引用
收藏
页码:867 / 871
页数:5
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