Characterization of Partial Discharge Activities in WBG Power Converters under Low-Pressure Condition

被引:10
作者
Borghei, Moein [1 ]
Ghassemi, Mona [1 ]
机构
[1] Virginia Tech, Dept Elect & Comp Engn, Blacksburg, VA 24061 USA
关键词
finite element analysis (FEA); high voltage systems; insulated-gate bipolar transistor (IGBT); insulation systems; low-pressure conditions; more-electric aircraft; partial discharge; ALL-ELECTRIC AIRCRAFT; PD; SIMULATION; FREQUENCY; SYSTEMS;
D O I
10.3390/en14175394
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Many sectors, such as transportation systems, are undergoing rapid electrification due to the need for the mitigation of CO2 emissions. To ensure safe and reliable operation, the electrical equipment must be able to work under various environmental conditions. At high altitudes, the low pressure can adversely affect the health of insulating materials of electrical systems in electric aircraft. A well-known, primary aging mechanism in dielectrics is partial discharge (PD). This study targets internal PD evaluation in an insulated-gate bipolar transistor (IGBT) module under low-pressure conditions. The estimation of electric field distribution is conducted through 3D finite element analysis (FEA) using COMSOL Multiphysics (R). The procedure of PD detection and transient modeling is performed in MATLAB for two pressure levels (atmospheric and half-atmospheric). The case study is the IGBT module with a void or two voids in the proximity of triple joints. The single-void case demonstrates that at half-atmospheric pressure, the intensity of discharges per voltage cycle increases by more than 40% compared to atmospheric pressure. The double-void case further shows that a void that is harmless at sea level can turn into an additional source of aging and couple with the other voids to escalate PD intensity by a factor of two or more.
引用
收藏
页数:12
相关论文
共 34 条
[1]   Electric Power Systems in More and All Electric Aircraft: A Review [J].
Barzkar, Ashkan ;
Ghassemi, Mona .
IEEE ACCESS, 2020, 8 :169314-169332
[2]   Simulation of the Electric Field Strength in the Vicinity of Metallization Edges on Dielectric Substrates [J].
Bayer, C. F. ;
Baer, E. ;
Waltrich, U. ;
Malipaard, D. ;
Schletz, A. .
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2015, 22 (01) :257-265
[3]  
Bayer CF, 2016, 2016 INTERNATIONAL CONFERENCE ON ELECTRONICS PACKAGING (ICEP), P530, DOI 10.1109/ICEP.2016.7486884
[4]  
Borghei Moein, 2019, 2019 IEEE Electric Ship Technologies Symposium (ESTS). Proceedings, P324, DOI 10.1109/ESTS.2019.8847797
[5]   Insulation Materials and Systems for More- and All-Electric Aircraft: A Review Identifying Challenges and Future Research Needs [J].
Borghei, Moein ;
Ghassemi, Mona .
IEEE TRANSACTIONS ON TRANSPORTATION ELECTRIFICATION, 2021, 7 (03) :1930-1953
[6]   A Finite Element Analysis Model for Partial Discharges in Silicone Gel under a High Slew Rate, High-Frequency Square Wave Voltage in Low-Pressure Conditions [J].
Borghei, Moein ;
Ghassemi, Mona .
ENERGIES, 2020, 13 (09)
[7]   Partial Discharge Analysis under High-Frequency, Fast-Rise Square Wave Voltages in Silicone Gel: A Modeling Approach [J].
Borghei, Moein ;
Ghassemi, Mona .
ENERGIES, 2019, 12 (23)
[8]  
Borghei M, 2019, 2019 IEEE ELECTRICAL INSULATION CONFERENCE (EIC), P34, DOI [10.1109/EIC43217.2019.9046525, 10.1109/eic43217.2019.9046525]
[9]   PARTIAL DISCHARGES IN ELLIPSOIDAL AND SPHEROIDAL VOIDS [J].
CRICHTON, GC ;
KARLSSON, PW ;
PEDERSEN, A .
IEEE TRANSACTIONS ON ELECTRICAL INSULATION, 1989, 24 (02) :335-342
[10]  
Fang L, 2013, 2013 IEEE ELECTRICAL INSULATION CONFERENCE (EIC), P253