Orientation dependence of dielectric and ferroelectric properties of Pb(Zr0.8Ti0.2)O3/Pb(Zr0.2Ti0.8)O3 multilayered thin films

被引：15

作者：

Wu, Jiagang ^{[1
]}

Xiao, Dingquan ^{[1
]}

Zhu, Jiliang ^{[1
]}

Zhu, Jianguo ^{[1
]}

机构：

[1] Sichuan Univ, Dept Mat Sci, Chengdu 610064, Peoples R China

来源：

APPLIED PHYSICS LETTERS | 2007年 / 91卷 / 19期

基金：

中国国家自然科学基金;

关键词：

D O I：

10.1063/1.2807839

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The Pb(Zr1-xTix)O-3 multilayered films consisting of Pb(Zr0.8Ti0.2)O-3 and Pb(Zr0.2Ti0.8)O-3 layers with different orientations were deposited by radio frequency magnetron sputtering with PbOx and LaNiO3 (LNO) buffer layers. The PbOx and LNO buffer layers lead to the (001)/(100) and (101)/(110) orientations of the multilayered films, respectively. The orientation dependence of electrical properties of the multilayered films was investigated. Enhanced remnant polarization (2P(r)=79.3 mu C/cm(2)) and dielectric constant (epsilon(r)=857) were obtained for the multilayered films with (001)/(100) orientation as compared to those of the multilayered films with other orientations. These results reveal that the orientation control is important in obtaining good electrical properties.

引用

页数：3

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