Detecting cyber-physical attacks in CyberManufacturing systems with machine learning methods

被引:161
作者
Wu, Mingtao [1 ]
Song, Zhengyi [1 ]
Moon, Young B. [1 ]
机构
[1] Syracuse Univ, Dept Mech & Aerosp Engn, Syracuse, NY 13244 USA
关键词
CyberManufacturing systems; Security; Additive manufacturing; Machine learning; ANOMALY DETECTION; CLASSIFICATION; SECURITY; DEFECTS;
D O I
10.1007/s10845-017-1315-5
中图分类号
TP18 [人工智能理论];
学科分类号
081104 ; 0812 ; 0835 ; 1405 ;
摘要
CyberManufacturing system (CMS) is a vision for future manufacturing systems. The concept delineates a vision of advanced manufacturing system integrated with technologies such as Internet of Things, Cloud Computing, Sensors Network and Machine Learning. As a result, cyber-attacks such as Stuxnet attack will increase along with growing simultaneous connectivity. Now, cyber-physical attacks are new and unique risks to CMSs and modern cyber security countermeasure is not enough. To learn this new vulnerability, the cyber-physical attacks is defined via a taxonomy under the vision of CMS. Machine learning on physical data is studied for detecting cyber-physical attacks. Two examples were developed with simulation and experiments: 3D printing malicious attack and CNC milling machine malicious attack. By implementing machine learning methods in physical data, the anomaly detection algorithm reached 96.1% accuracy in detecting cyber-physical attacks in 3D printing process; random forest algorithm reached on average 91.1% accuracy in detecting cyber-physical attacks in CNC milling process.
引用
收藏
页码:1111 / 1123
页数:13
相关论文
共 31 条
[1]  
[Anonymous], 2015, HACK REM KILL JEEP H
[2]  
[Anonymous], 2016, REV YEAR SER DAT BRE
[3]  
Bosch A, 2007, IEEE I CONF COMP VIS, P1863
[4]   Multi-sensor data fusion framework for CNC machining monitoring [J].
Duro, Joao A. ;
Padget, Julian A. ;
Bowen, Chris R. ;
Kim, H. Alicia ;
Nassehi, Aydin .
MECHANICAL SYSTEMS AND SIGNAL PROCESSING, 2016, 66-67 :505-520
[5]  
Garcia RF, 2011, ADV INTEL SOFT COMPU, V87, P405
[6]   An introduction to biometric recognition [J].
Jain, AK ;
Ross, A ;
Prabhakar, S .
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS FOR VIDEO TECHNOLOGY, 2004, 14 (01) :4-20
[7]   An intelligent real-time vision system for surface defect detection [J].
Jia, HB ;
Murphey, YL ;
Shi, JJ ;
Chang, TS .
PROCEEDINGS OF THE 17TH INTERNATIONAL CONFERENCE ON PATTERN RECOGNITION, VOL 3, 2004, :239-242
[8]  
Karthikeyan K. R, 2010, International Journal of Computer Theory and Engineering, P901, DOI [10.7763/IJCTE.2010.V2.260, DOI 10.7763/IJCTE.2010.V2.260]
[9]  
Kelley Michael B., 2013, Business Insider
[10]  
Kim AC, 2013, INT J SECUR APPL, V7, P181