Bending strain characteristics of critical current in double-layered Bi-2223 superconducting tapes

被引:6
作者
Shin, Hyung-Seop [1 ]
Dizon, John R. C. [2 ]
Bonifacio, Rolly [2 ]
Park, Sung-Taek [2 ]
Ha, Dong-Woo [3 ]
Oh, Sang-Soo [3 ]
机构
[1] Andong Natl Univ, Sch Mech Engn, Andong 760749, Kyungbuk, South Korea
[2] Andong Natl Univ, Grad Sch, Dept Mech Engn, Andong 760749, Kyungbuk, South Korea
[3] Korea Electrotechnol Res Inst, Appl Superconductiv Res Grp, Chang Won 641120, Kyungnam, South Korea
关键词
bending strain; Bi-2223; tapes; critical current; double-layered; pressurized LN2; thermal cycle;
D O I
10.1109/TASC.2008.921276
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The evaluation of reliability of HTS tapes is necessary for practical applications such as magnet, power cables, motors, SMES and HTS coils. The bending strain effect on the critical current, I-c, in multifilamentary Bi-2223 HTS tapes have been investigated. Single and double layered tapes (for high current capacity) were subjected to thermal and pressurization cycles at pressurized liquid nitrogen (LN2) up to 1 MPa. After the pressurization test, the subsequent occurrence of damage like ballooning due to the diffusion and expansion of LN2 into the tapes were investigated and compared. The Bi-2223 tapes showed different I-c degradation behavior depending upon the geometry and ratio of reinforcement to superconductor adopted.
引用
收藏
页码:1155 / 1158
页数:4
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