Active damping by Q-control for fast force-distance curve measurements in atomic force microscopy

被引：7
作者：
Kohl, D. [1 ]
Kerschner, C. [1 ]
Schitter, G. [1 ]
机构：
[1] Vienna Univ Technol, Automat & Control Inst ACIN, Gusshausstr 27-29-E376, A-1040 Vienna, Austria
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2017年 / 88卷 / 12期
关键词：
SPEED; AFM; DESIGN; LIQUID;
D O I：
10.1063/1.4991604
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
This paper investigates the benefit of active damping by an analog Q-control circuit for measuring fast force-distance curves in atomic force microscopy. By active damping of the cantilever oscillation after snap-off, the down-ring time-constant is reduced significantly from 385 mu s to 23 mu s. Experimental results demonstrate that the number of force-distance curves per second can be increased by a factor of more than 30. Published by AIP Publishing.
引用
收藏
页数：5
相关论文
共 21 条
  • [1] Analysis of the interaction mechanisms in dynamic mode SFM by means of experimental data and computer simulation
    Anczykowski, B
    Cleveland, JP
    Kruger, D
    Elings, V
    Fuchs, H
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 1998, 66 (Suppl 1): : S885 - S889
  • [2] High-speed atomic force microscopy
    Ando, Toshio
    [J]. MICROSCOPY, 2013, 62 (01) : 81 - 93
  • [3] ATOMIC FORCE MICROSCOPE
    BINNIG, G
    QUATE, CF
    GERBER, C
    [J]. PHYSICAL REVIEW LETTERS, 1986, 56 (09) : 930 - 933
  • [4] How does a tip tap?
    Burnham, NA
    Behrend, OP
    Oulevey, F
    Gremaud, G
    Gallo, PJ
    Gourdon, D
    Dupas, E
    Kulik, AJ
    Pollock, HM
    Briggs, GAD
    [J]. NANOTECHNOLOGY, 1997, 8 (02) : 67 - 75
  • [5] MEASURING THE NANOMECHANICAL PROPERTIES AND SURFACE FORCES OF MATERIALS USING AN ATOMIC FORCE MICROSCOPE
    BURNHAM, NA
    COLTON, RJ
    [J]. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-VACUUM SURFACES AND FILMS, 1989, 7 (04): : 2906 - 2913
  • [6] Cantilever dynamics and quality factor control in AC mode AFM height measurements
    Chen, Liwei
    Yu, Xuechun
    Wang, Dan
    [J]. ULTRAMICROSCOPY, 2007, 107 (4-5) : 275 - 280
  • [7] Eaton P.J., 2014, Atomic force microscopy
  • [8] Theory of Q-Controlled dynamic force microscopy in air
    Hoelscher, H.
    Ebeling, D.
    Schwarz, U. D.
    [J]. JOURNAL OF APPLIED PHYSICS, 2006, 99 (08)
  • [9] Horowitz P., 1983, ART ELECT
  • [10] Modulated-demodulated control: Q control of an AFM microcantilever
    Karvinen, K. S.
    Moheimani, S. O. R.
    [J]. MECHATRONICS, 2014, 24 (06) : 661 - 671
123