Failure-rate Analysis Considering Operational Condition of Half-bridge Submodule in HVDC System

被引:0
|
作者
Heo, Dae-ho [1 ]
Kang, Feel-soon [1 ]
Song, Sung-Geun [2 ]
机构
[1] Hanbat Natl Univ, Dept Elect & Control Engn, Daejeon, South Korea
[2] Korea Elect Technol Inst, Energy Convers Res Ctr, Gwangju, South Korea
来源
2019 INTERNATIONAL SYMPOSIUM ON ELECTRICAL AND ELECTRONICS ENGINEERING (ISEE 2019) | 2019年
关键词
fault-tree analysis (FTA); half-bridge; modular multilevel converter (MMC); mean time between failure (MTBF); HVDC; part failure; sub-module; RELIABILITY;
D O I
10.1109/isee2.2019.8921368
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The half-bridge submodule is a unit system of MMC and consists of three main circuit components: IGBT, diode, and capacitor. Failure of the part causes the submodule failure, and this failure extends to the failure of the upper system of the MMC, which eventually leads to failure of the HVDC. Therefore, the lifetime prediction of the submodule is used as an important index to predict the failure of HVDC system. However, the conventional part failure analysis considering only the type and number of parts cannot reflect the operational characteristics of the system. To overcome this problem, we design a fault-tree that reflects the operational characteristics of the half-bridge submodule and estimate the lifetime of the submodule by applying the failure-rate of MIL-HDBK-217F to the basic event. The validity of the proposed fault-tree analysis is verified by comparing with the conventional part failure analysis method.
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页码:252 / 256
页数:5
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