A High-Resolution Time-to-Digital Converter on FPGA Using Dynamic Reconfiguration

被引:32
作者
Daigneault, Marc-Andre [1 ]
David, Jean Pierre [1 ]
机构
[1] Ecole Polytech, Res Grp Microelect & Microsyst, Dept Elect Engn, Montreal, PQ H3C 3A7, Canada
关键词
Dynamic reconfiguration; field-programmable gate array (FPGA); time-interval measurement; time-to-digital converter (TDC); CMOS; ARCHITECTURE;
D O I
10.1109/TIM.2011.2115390
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
A high-resolution high-precision time-to-digital converter (TDC) architecture is presented for implementation on field-programmable gate arrays (FPGAs) supporting dynamic reconfiguration. The proposed architecture relies on multiple parallel high-resolution delay lines implemented by the programmable interconnection points within the routing switch fabric. These delay lines feature a 1-ps resolution over a range of 3 ns. A calibration process is proposed to take process-voltage-temperature variations, as well as clock skew, into account. A TDC with a 50-ps resolution and precision as high as 35 ps has been implemented on a Virtex-II Pro FPGA. Results show that the proposed architecture and calibration process can be used to achieve resolutions as fine as 10 ps.
引用
收藏
页码:2070 / 2079
页数:10
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