Modeling and experimental observation of an on-chip two-dimensional far-field interference pattern

被引：2

作者：

Hosseini, Amir ^{[1
,2
]}

Kwong, David ^{[1
,2
]}

Zhang, Yang ^{[1
,2
]}

Alu, Andrea ^{[1
]}

Chen, Ray T. ^{[1
,2
]}

机构：

[1] Univ Texas Austin, Dept Elect & Comp Engn, Austin, TX 78712 USA

[2] Univ Texas Austin, Miroelect Res Ctr, Austin, TX 78758 USA

来源：

APPLIED OPTICS | 2011年 / 50卷 / 13期

关键词：

FLATLAND OPTICS; ANALOG;

D O I：

10.1364/AO.50.001822

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

In this paper, we model and experimentally observe the far-field radiation produced by interfering beams propagating in two-dimensional (2D) slab waveguides. Using a transmission-line analogy, we compare the 2D propagation with standard three-dimensional (3D) far-field representations and derive the 2D conditions for using standard far-field approximations. Then we test our theoretical results by experimentally observing the 2D far-field pattern produced by a 1 x 3 multimode interference (MMI) coupler on a silicon nanomembrane. The MMI outputs are connected to a slab silicon waveguide, and the far field is observed at the edge of the silicon slab. This represents the observation of 2D far-field pattern produced by an array of on-chip radiators. (C) 2011 Optical Society of America

引用

页码：1822 / 1826

页数：5

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