Kelvin Probe Force Microscopy of Defects in ZnO Nanocrystals Associated with Emission at 3.31 eV

被引：10
作者：
Kurbanov, Saidislam [1 ,2 ]
Yang, Woo Chul [1 ,3 ]
Kang, Tae Won [1 ]
机构：
[1] Dongguk Univ Seoul, Quantum Funct Semicond Res Ctr, Seoul 100715, South Korea
[2] Uzbek Acad Sci, Heat Phys Dept, Tashkent 700135, Uzbekistan
[3] Dongguk Univ Seoul, Dept Phys, Seoul 100715, South Korea
来源：
APPLIED PHYSICS EXPRESS | 2011年 / 4卷 / 02期
关键词：
EXCITON;
D O I：
10.1143/APEX.4.021101
中图分类号：
O59 [应用物理学];
学科分类号：
摘要：
The surface potential variations on ZnO nanocrystal surfaces were investigated by using Kelvin probe force microscopy. It was found that the nanocrystal surface contains randomly distributed circular pits with a diameter of similar to 100nm and a depth of similar to 30 nm and that the surface potential within the pits is lower than that in the vicinity of the pits. We discuss the correlation between the observed pits and speck-like defects on a ZnO nanocrystal surface associated with the emission at 3.31 eV. We suggest that the reduced surface potential is caused by the local acceptor-like states concentrated near the structural defects. (C) 2011 The Japan Society of Applied Physics
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页数：3
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