Fabrication and performance comparison of planar and sandwich structures of micro-bolometers with Ge thermo-sensing layer

被引:45
作者
Moreno, M. [1 ]
Kosarev, A. [1 ]
Torres, A. [1 ]
Ambrosio, R. [1 ]
机构
[1] Natl Inst Atrophys Opt & Elect, Puebla, Mexico
关键词
amorphous materials; germanium; silicon; AMORPHOUS GEXSI1-XOY; MICROBOLOMETER;
D O I
10.1016/j.tsf.2006.11.172
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Two types of micro-bolometer structures were fabricated with the same materials and fabrication process. The structures are labeled planar and sandwich types. Their performance was measured and a comparison was performed among these structures. Our results show that the sandwich type structure behaves better in terms of the voltage and current responsivity, but shows 2 to 3 orders of magnitude higher If noise levels. In spite that the sandwich configuration shows a lower response time constant than that of the planar device, the noise level makes the detectivity, of both devices practically the same. (c) 2006 Elsevier B.V. All tights reserved.
引用
收藏
页码:7607 / 7610
页数:4
相关论文
共 5 条
  • [1] Noise behavior of amorphous GexSi1-xOy for microbolometer applications
    Ahmed, A
    Tait, RN
    [J]. INFRARED PHYSICS & TECHNOLOGY, 2005, 46 (06) : 468 - 472
  • [2] Characterization of an amorphous GexSi1-xOy microbolometer for thermal imaging applications
    Ahmed, AHZ
    Tait, RN
    [J]. IEEE TRANSACTIONS ON ELECTRON DEVICES, 2005, 52 (08) : 1900 - 1906
  • [3] Low frequency plasma deposition and characterization of Si1-xGex:H,F films
    Ambrosio, R
    Torres, A
    Kosarev, A
    Ilinski, A
    Zúñiga, C
    Abramov, AS
    [J]. JOURNAL OF NON-CRYSTALLINE SOLIDS, 2004, 338 : 91 - 96
  • [4] IR uncooled bolometers based on amorphous GexSi1-xOy on silicon micromachined structures
    Iborra, E
    Clement, M
    Herrero, LV
    Sangrador, J
    [J]. JOURNAL OF MICROELECTROMECHANICAL SYSTEMS, 2002, 11 (04) : 322 - 329
  • [5] SYLLAIOS AJ, 2000, MAT RES SOC S P, V609