Identification of photocurrents in topological insulators

被引：25

作者：

Bas, Derek A. ^{[1
]}

Muniz, Rodrigo A. ^{[2
,3
]}

Babakiray, Sercan ^{[1
]}

Lederman, David ^{[1
]}

Sipe, J. E. ^{[2
,3
]}

Bristow, Alan D. ^{[1
]}

机构：

[1] West Virginia Univ, Dept Phys & Astron, Morgantown, WV 26506 USA

[2] Univ Toronto, Dept Phys, Toronto, ON M5S 1A7, Canada

[3] Univ Toronto, Inst Opt Sci, Toronto, ON M5S 1A7, Canada

来源：

OPTICS EXPRESS | 2016年 / 24卷 / 20期

基金：

加拿大自然科学与工程研究理事会; 美国国家科学基金会;

关键词：

QUANTUM INTERFERENCE CONTROL; SHIFT CURRENTS; SURFACE-STATES; RECTIFICATION; INJECTION; EMISSION; BI2SE3;

D O I：

10.1364/OE.24.023583

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

Optical injection and detection of charge currents is an alternative to conventional transport and photoemission measurements, avoiding the necessity of invasive contact that may disturb the system being examined. This is a particular concern for analyzing the surface states of topological insulators. In this work one-and two-color sources of photocurrents are isolated and examined in epitaxial thin films of Bi2Se3. We demonstrate that optical excitation and terahertz detection simultaneously captures one-and two-color photocurrent contributions, which has not been required for other material systems. A method is devised to extract the two components, and in doing so each can be related to surface or bulk excitations through symmetry. The separation of such photocurrents in topological insulators opens a new avenue for studying these materials by all-optical methods. (C) 2016 Optical Society of America

引用

页码：23583 / 23595

页数：13

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