A large area X-ray imager with online linearization and noise suppression

被引：2

作者：

He, T. ^{[1
]}

Durst, Roger ^{[1
]}

Becker, Bruce L. ^{[1
]}

Kaercher, Joerg ^{[1
]}

Wachter, Greg ^{[1
]}

机构：

[1] Bruker AXS Inc, Madison, WI 53711 USA

来源：

HARD X-RAY, GAMMA-RAY, AND NEUTRON DETECTOR PHYSICS XIII | 2011年 / 8142卷

关键词：

CMOS; image sensor; Active pixel; X-ray diffraction; DETECTOR;

D O I：

10.1117/12.899721

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

A new large area imager for X-ray crystallography is described based on active pixel sensor technology. In order to meet the demanding requirements for crystallography the detector is designed with real time correction for reset noise, nonlinearity, spatial uniformity and bad pixels. The design of the detector is described along with its operating characteristics including noise, DQE and quantum gain. We describe new techniques to rapidly calibrate and characterize the X-ray imager.

引用

页数：8

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