Reset and partition noise in active pixel image sensors

被引：5
|
作者：
Lai, J [1 ]
Nathan, A [1 ]
机构：
[1] Univ Waterloo, Dept Elect & Comp Engn, Waterloo, ON N2L 3G1, Canada
来源：
IEEE TRANSACTIONS ON ELECTRON DEVICES | 2005年 / 52卷 / 10期
关键词：
image sensors; partition noise; reset noise; transistor turn-off transient;
D O I：
10.1109/TED.2005.856192
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Partition noise appears in conjunction with reset noise at the integration node of active pixel sensor architectures. This brief presents the modeling and measurement of partition noise based on an improved technique for charge profile estimation in the transistor channel at any given time instant. Mransistor turn off transients are integrated into the model by taking into account both drift and diffusion components of current. Using the predictions of charge profile, partition noise generated during the transistor reset operation is accurately determined and verified with measured data.
引用
收藏
页码：2329 / 2332
页数：4
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