Compact-2D: A Physical Design Methodology to Build Commercial-Quality Face-to-Face-Bonded 3D ICs

被引:39
作者
Ku, Bon Woong [1 ]
Chang, Kyungwook [1 ]
Lim, Sung Kyu [1 ]
机构
[1] Georgia Inst Technol, Sch ECE, Atlanta, GA 30332 USA
来源
PROCEEDINGS OF THE 2018 INTERNATIONAL SYMPOSIUM ON PHYSICAL DESIGN (ISPD'18) | 2018年
关键词
Compact-2D; Physical Design Methodology; Wafer-level Bonding; Face-to-Face (F2F) Bonded 3D ICs; STACKING;
D O I
10.1145/3177540.3178244
中图分类号
TP3 [计算技术、计算机技术];
学科分类号
0812 ;
摘要
The recent advancement of wafer bonding technology offers fine-grained and silicon-space overhead-free 3D interconnections in face-to-face (F2F) bonded 3D ICs. In this paper, we propose a full-chip RTL-to-GDSII physical design solution to build high-density and commercial-quality two-tier F2F-bonded 3D ICs. The state-of-the-art flow named Shrunk-2D (S2D) [10] requires shrinking of standard cells and interconnects by a factor of 50% to fit into the target 3D footprint of a two-tier design. This, unfortunately, necessitates commercial place/route engines that handle one node smaller geometries, which can be challenging and costly. Our flow named Compact-2D (C2D) does not require any geometry shrinking. Instead, C2D implements a 2D IC with scaled interconnect RC parasitics, and contracts the layout to the F2F design footprint. In addition, C2D offers post-tier-partitioning optimization that is shown to be effective in fixing timing violations caused by inter-tier 3D routing, which is completely missing in S2D. Lastly, we present a methodology to recycle the routing result of post-tier-partitioning optimization for final GDSII generation. Our experimental results show that at iso-performance, C2D offers up to 26.8% power reduction and 15.6% silicon area savings over commercial 2D ICs without any routing resource overhead.
引用
收藏
页码:90 / 97
页数:8
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