Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

被引：147

作者：

Giessibl, FJ ^{[1
]}

Bielefeldt, H ^{[1
]}

Hembacher, S ^{[1
]}

Mannhart, J ^{[1
]}

机构：

[1] Univ Augsburg, Inst Phys Elect Correlat & Magnetism, D-86135 Augsburg, Germany

来源：

APPLIED SURFACE SCIENCE | 1999年 / 140卷 / 3-4期

关键词：

atomic force microscopy; frequency modulation atomic force microscopy; dynamic force microscopy; atomic resolution; tip-sample interaction; dissipation; thermal noise;

D O I：

10.1016/S0169-4332(98)00553-4

中图分类号：

O64 [物理化学（理论化学）、化学物理学];

学科分类号：

070304 ; 081704 ;

摘要：

True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal set of parameters from first principles as a function of the tip-sample system. The result shows that the tither the acquisition rate or the signal-to-noise ratio could be increased by up to two orders of magnitude by using stiffer cantilevers and smaller amplitudes than an in use today. (C) 1999 Elsevier Science B.V. All rights reserved.

引用

页码：352 / 357

页数：6

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