High-Fidelity Trapped-Ion Quantum Logic Using Near-Field Microwaves

被引:104
作者
Harty, T. P. [1 ]
Sepiol, M. A. [1 ]
Allcock, D. T. C. [1 ,2 ]
Ballance, C. J. [1 ]
Tarlton, J. E. [1 ]
Lucas, D. M. [1 ]
机构
[1] Univ Oxford, Dept Phys, Clarendon Lab, Parks Rd, Oxford OX1 3PU, England
[2] NIST, 325 Broadway, Boulder, CO 80305 USA
基金
英国工程与自然科学研究理事会;
关键词
GATES;
D O I
10.1103/PhysRevLett.117.140501
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
We demonstrate a two-qubit logic gate driven by near-field microwaves in a room-temperature microfabricated surface ion trap. We introduce a dynamically decoupled gate method, which stabilizes the qubits against fluctuating energy shifts and avoids the need to null the microwave field. We use the gate to produce a Bell state with fidelity 99.7(1)%, after accounting for state preparation and measurement errors. The gate is applied directly to Ca-43(+) hyperfine "atomic clock" qubits (coherence time T*(2) approximate to 50 s) using the oscillating magnetic field gradient produced by an integrated microwave electrode.
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页数:6
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