High-Fidelity Trapped-Ion Quantum Logic Using Near-Field Microwaves

被引：111

作者：

Harty, T. P. ^{[1
]}

Sepiol, M. A. ^{[1
]}

Allcock, D. T. C. ^{[1
,2
]}

Ballance, C. J. ^{[1
]}

Tarlton, J. E. ^{[1
]}

Lucas, D. M. ^{[1
]}

机构：

[1] Univ Oxford, Dept Phys, Clarendon Lab, Parks Rd, Oxford OX1 3PU, England

[2] NIST, 325 Broadway, Boulder, CO 80305 USA

来源：

PHYSICAL REVIEW LETTERS | 2016年 / 117卷 / 14期

基金：

英国工程与自然科学研究理事会;

关键词：

GATES;

D O I：

10.1103/PhysRevLett.117.140501

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

We demonstrate a two-qubit logic gate driven by near-field microwaves in a room-temperature microfabricated surface ion trap. We introduce a dynamically decoupled gate method, which stabilizes the qubits against fluctuating energy shifts and avoids the need to null the microwave field. We use the gate to produce a Bell state with fidelity 99.7(1)%, after accounting for state preparation and measurement errors. The gate is applied directly to Ca-43(+) hyperfine "atomic clock" qubits (coherence time T*(2) approximate to 50 s) using the oscillating magnetic field gradient produced by an integrated microwave electrode.

引用

页数：6

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