PLC advanced technology demonstrator TestChipB

被引：6
|
作者：
Vaida, T [1 ]
机构：
[1] LSI Log Corp, Boulder, CO USA
来源：
PROCEEDINGS OF THE IEEE 2001 CUSTOM INTEGRATED CIRCUITS CONFERENCE | 2001年
关键词：
D O I：
10.1109/CICC.2001.929725
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：67 / 70
页数：4
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