Neutron time-of-flight reflectometer GRAINS with horizontal sample plane at the IBR-2 reactor: Possibilities and prospects

被引：24

作者：

Avdeev, M. V. ^{[1
]}

Bodnarchuk, V. I. ^{[1
]}

Petrenko, V. I. ^{[1
,2
]}

Gapon, I. V. ^{[1
,2
]}

Tomchuk, O. V. ^{[1
,2
]}

Nagorny, A. V. ^{[1
,2
]}

Ulyanov, V. A. ^{[3
]}

Bulavin, L. A. ^{[2
]}

Aksenov, V. L. ^{[1
,3
]}

机构：

[1] Joint Inst Nucl Res, Frank Lab Neutron Phys, Dubna, Moscow Oblast, Russia

[2] Taras Shevchenko Natl Univ Kyiv, Kiev, Ukraine

[3] Konstantinov Petersburg Nucl Phys Inst, Natl Res Ctr, Kurchatov Inst, Gatchina, Russia

来源：

CRYSTALLOGRAPHY REPORTS | 2017年 / 62卷 / 06期

关键词：

SYSTEMS; REFLECTIVITY; ADSORPTION; INTERFACE; MODERATOR; PROTEINS;

D O I：

10.1134/S1063774517060025

中图分类号：

O7 [晶体学];

学科分类号：

0702 ; 070205 ; 0703 ; 080501 ;

摘要：

A new time-of-flight neutron reflectometer GRAINS with a horizontal sample plane (vertical scattering plane) has recently been put into operation at the pulsed reactor IBR-2 (JINR, Dubna). The scattering geometry applied makes it possible to carry out complex studies of nanostructured interfaces in solid and liquid states by measuring the specular reflectivity and the intensity of diffuse scattering of thermal neutrons from open surfaces and hidden interlayer boundaries, including solid-liquid interfaces, over a wide momentum transfer range. The classical analysis of specular reflectivity allows one to determine the scattering length density profile in the object under study in a direction perpendicular to the interface for a thickness of similar to 100 nm with a resolution of 1 nm. The analysis of off-specular (diffuse) neutron scattering makes it possible to characterize lateral correlations on surfaces and interlayer boundaries. The paper summarizes the first experience in the operation of the GRAINS reflectometer. The instrument characteristics are presented together with the possibilities for experiments with solid and liquid samples illustrated with simple systems. Further steps for the development of the reflectometer are discussed.

引用

页码：1002 / 1008

页数：7