Performance evaluation of an IGBT module by thermal analysis using fiber Bragg grating

被引：3

作者：

Bazzo, Joao Paulo ^{[1
]}

Lukasievicz, Tiago ^{[1
]}

Vogt, Marcio ^{[1
]}

Martins, Mario L. S. ^{[1
]}

Kalinowski, Hypolito J. ^{[2
]}

Silva, Jean C. C. ^{[1
]}

机构：

[1] Univ Tecnol Fed Parana, Elect Engn Grad Program PPGEE, BR-80230901 Curitiba, Parana, Brazil

[2] Univ Tecnol Fed Parana, Grad Program Elect Engn & Appl Comp Sci CPGEI, BR-80230901 Curitiba, Parana, Brazil

来源：

FOURTH EUROPEAN WORKSHOP ON OPTICAL FIBRE SENSORS | 2010年 / 7653卷

关键词：

IGBT modules; semiconductor junction temperature; thermal analysis; fiber Bragg gratings;

D O I：

10.1117/12.866360

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper proposes a new method to estimate the energy losses in insulated gate bipolar transistors (IGBT) modules. The technique is based on measuring the temperature of the semiconductor junction through optical sensors based on fiber Bragg gratings. The IGBT module is monitored through software, enabling a real-time evaluation of performance, which facilitates the analysis of the device in different operating conditions. The results are compared with conventional techniques to validate the method.

引用

页数：4

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