Recent Applications of Moire Interferometry

被引:40
|
作者
Ifju, P. G. [1 ]
Han, B. [2 ]
机构
[1] Univ Florida, Gainesville, FL 32611 USA
[2] Univ Maryland, Dept Mech Engn, College Pk, MD 20742 USA
关键词
Moire interferometry; Microelectronics devices; Material characterization; Micromechanics; Residual stress; Composite materials; Fracture mechanics; Biomechanics; FLIP-CHIP PACKAGE; MICROMECHANICAL DEFORMATION ANALYSIS; RESIDUAL-STRESS DETERMINATION; HIGH-SENSITIVITY MEASUREMENT; THERMAL CYCLING CONDITION; TIP DISPLACEMENT-FIELDS; SOLDER JOINTS; THERMOMECHANICAL BEHAVIOR; MOLD COMPOUNDS; CRACK-GROWTH;
D O I
10.1007/s11340-010-9404-9
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
Moir, interferometry has been a valuable experimental technique for the understanding of the mechanical behavior of materials and structures. Over the last decade less emphasis has been placed on the development of the technique and more towards applications. This paper is a review article on recent applications using moir, interferometry in the fields of microelectronics devices, material characterization, micromechanics, residual stress, composite materials, fracture mechanics, and biomechanics. The general principles of moir, interferometry and advancement of techniques will not be discussed in this text, but references will be provided.
引用
收藏
页码:1129 / 1147
页数:19
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