Single-shot x-ray phase-contrast and dark-field imaging based on coded binary phase mask

被引：15

作者：

Qiao, Zhi ^{[1
]}

Shi, Xianbo ^{[1
]}

Wojcik, Michael J. ^{[1
]}

Rebuffi, Luca ^{[1
]}

Assoufid, Lahsen ^{[1
]}

机构：

[1] Argonne Natl Lab, Adv Photon Source, Argonne, IL 60439 USA

来源：

APPLIED PHYSICS LETTERS | 2021年 / 119卷 / 01期

关键词：

TOMOGRAPHY;

D O I：

10.1063/5.0053553

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We introduce a coded-mask-based multi-contrast imaging method for high-resolution phase-contrast and dark-field imaging. The method uses a binary phase mask designed to provide an ultra-high-contrast pattern and reference-free single-shot measurement and an algorithm based on maximum-likelihood optimization and automatic differentiation to perform simultaneous reconstruction of absorption, phase, and dark-field object images. Further, we demonstrate that the method has great potential for real-time quantitative phase imaging and wavefront sensing when combined with deep learning.

引用

页数：5

共 39 条

[1]

Abadi M, 2016, PROCEEDINGS OF OSDI'16: 12TH USENIX SYMPOSIUM ON OPERATING SYSTEMS DESIGN AND IMPLEMENTATION, P265

[2] The Nanolithography Toolbox [J].

Balram, Krishna C. ;

Westly, Daron A. ;

Davanco, Marcelo ;

Grutter, Karen E. ;

Li, Qing ;

Michels, Thomas ;

Ray, Christopher H. ;

Yu, Liya ;

Kasica, Richard J. ;

Wallin, Christopher B. ;

Gilbert, Ian J. ;

Bryce, Brian A. ;

Simelgor, Gregory ;

Topolancik, Juraj ;

Lobontiu, Nicolae ;

Liu, Yuxiang ;

Neuzil, Pavel ;

Svatos, Vojtech ;

Dill, Kristen A. ;

Bertrand, Neal A. ;

Metzler, Meredith G. ;

Lopez, Gerald ;

Czaplewski, David A. ;

Ocola, Leonidas ;

Srinivasan, Kartik A. ;

Stavis, Samuel M. ;

Aksyuk, Vladimir A. ;

Liddle, J. Alexander ;

Krylov, Slava ;

Ilic, B. Robert .

JOURNAL OF RESEARCH OF THE NATIONAL INSTITUTE OF STANDARDS AND TECHNOLOGY, 2016, 121 :464-475

[3] X-ray optics and beam characterization using random modulation: experiments [J].

Berujon, Sebastien ;

Cojocaru, Ruxandra ;

Piault, Pierre ;

Celestre, Rafael ;

Roth, Thomas ;

Barrett, Raymond ;

Ziegler, Eric .

JOURNAL OF SYNCHROTRON RADIATION, 2020, 27 :293-304

[4] X-ray optics and beam characterization using random modulation: theory [J].

Berujon, Sebastien ;

Cojocaru, Ruxandra ;

Piault, Pierre ;

Celestre, Rafael ;

Roth, Thomas ;

Barrett, Raymond ;

Ziegler, Eric .

JOURNAL OF SYNCHROTRON RADIATION, 2020, 27 :284-292

[5] X-ray multimodal imaging using a random-phase object [J].

Berujon, Sebastien ;

Wang, Hongchang ;

Sawhney, Kawal .

PHYSICAL REVIEW A, 2012, 86 (06)

[6] Two-Dimensional X-Ray Beam Phase Sensing [J].

Berujon, Sebastien ;

Ziegler, Eric ;

Cerbino, Roberto ;

Peverini, Luca .

PHYSICAL REVIEW LETTERS, 2012, 108 (15)

[7] Distributed optimization and statistical learning via the alternating direction method of multipliers [J].

Boyd S. ;

Parikh N. ;

Chu E. ;

Peleato B. ;

Eckstein J. .

Foundations and Trends in Machine Learning, 2010, 3 (01) :1-122

[8] Complementary X-ray tomography techniques for histology-validated 3D imaging of soft and hard tissues using plaque-containing blood vessels as examples [J].

Holme, Margaret N. ;

Schulz, Georg ;

Deyhle, Hans ;

Weitkamp, Timm ;

Beckmann, Felix ;

Lobrinus, Johannes A. ;

Rikhtegar, Farhad ;

Kurtcuoglu, Vartan ;

Zanette, Irene ;

Saxer, Till ;

Mueller, Bert .

NATURE PROTOCOLS, 2014, 9 (06) :1401-1415

[9] Systematic-error-free wavefront measurement using an X-ray single-grating interferometer [J].

Inoue, Takato ;

Matsuyama, Satoshi ;

Kawai, Shogo ;

Yumoto, Hirokatsu ;

Inubushi, Yuichi ;

Osaka, Taito ;

Inoue, Ichiro ;

Koyama, Takahisa ;

Tono, Kensuke ;

Ohashi, Haruhiko ;

Yabashi, Makina ;

Ishikawa, Tetsuya ;

Yamauchi, Kazuto .

REVIEW OF SCIENTIFIC INSTRUMENTS, 2018, 89 (04)

[10] Two-dimensional grating-based X-ray phase-contrast imaging using Fourier transform phase retrieval [J].

Itoh, Hidenosuke ;

Nagai, Kentaro ;

Sato, Genta ;

Yamaguchi, Kimiaki ;

Nakamura, Takashi ;

Kondoh, Takeshi ;

Ouchi, Chidane ;

Teshima, Takayuki ;

Setomoto, Yutaka ;

Den, Toru .

OPTICS EXPRESS, 2011, 19 (04) :3339-3346

← 1 2 3 4 →