Novel interferometer in the soft x-ray region

被引：12

作者：

Dambach, S ^{[1
]}

Backe, H ^{[1
]}

Doerk, T ^{[1
]}

Eftekhari, N ^{[1
]}

Euteneuer, H ^{[1
]}

Gorgen, F ^{[1
]}

Hagenbuck, F ^{[1
]}

Kaiser, KH ^{[1
]}

Kettig, O ^{[1
]}

Kube, G ^{[1
]}

Lauth, W ^{[1
]}

Schope, H ^{[1
]}

Steinhof, A ^{[1
]}

Tonn, T ^{[1
]}

Walcher, T ^{[1
]}

机构：

[1] Univ Mainz, Inst Kernphys, D-55099 Mainz, Germany

来源：

PHYSICAL REVIEW LETTERS | 1998年 / 80卷 / 25期

关键词：

D O I：

10.1103/PhysRevLett.80.5473

中图分类号：

O4 [物理学];

学科分类号：

0702 ;

摘要：

A novel interferometer has been developed with which the complex index of refraction of thin self-supporting foils can be measured in the vacuum ultraviolet and soft x-ray region. It consists of two collinear undulators and a grating spectrometer. Taking advantage of the low emittance 855 MeV electron beam from the Mainz Microtron, distinct intensity oscillations have been observed as a function of the distance between the undulators. A foil placed between the undulators causes a phase shift and an attenuation of the oscillation amplitude. The complex index of refraction has been measured at the K-absorption edge of carbon.

引用

页码：5473 / 5476

页数：4

共 18 条

[1] TAILLESS X-RAY SINGLE-CRYSTAL REFLECTION CURVES OBTAINED BY MULTIPLE REFLECTION - (SI GE CRYSTALS - E/T) [J].