Lateral shearing interferometry of high-harmonic wavefronts

被引：37

作者：

Austin, Dane R. ^{[2
]}

Witting, Tobias ^{[1
,2
]}

Arrell, Christopher A. ^{[1
]}

Frank, Felix ^{[1
]}

Wyatt, Adam S. ^{[2
]}

Marangos, Jon P. ^{[1
]}

Tisch, John W. G. ^{[1
]}

Walmsley, Ian A. ^{[2
]}

机构：

[1] Univ London Imperial Coll Sci Technol & Med, Blackett Lab, Quantum Opt & Laser Sci Grp, London SW7 2BW, England

[2] Univ Oxford, Clarendon Lab, Oxford OX1 3PU, England

来源：

OPTICS LETTERS | 2011年 / 36卷 / 10期

基金：

英国工程与自然科学研究理事会;

关键词：

PULSES; LASER;

D O I：

10.1364/OL.36.001746

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

We present a technique for frequency-resolved wavefront characterization of high harmonics based on lateral shearing interferometry. Tilted replicas of the driving laser pulse are produced by a Mach-Zehnder interferometer, producing separate focii in the target. The interference of the resulting harmonics on a flat-field extreme ultraviolet spectrometer yields the spatial phase derivative. A comprehensive set of spatial profiles, resolved by harmonic order, validate the technique and reveal the interplay of single-atom and macroscopic effects. (C) 2011 Optical Society of America

引用

页码：1746 / 1748

页数：3

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