Library-based process test vehicle design framework

被引：1

作者：

Doong, KYY ^{[1
]}

Hung, LJ ^{[1
]}

Ho, S ^{[1
]}

Young, KL ^{[1
]}

Lin, SC ^{[1
]}

机构：

[1] Taiwan Semicond Mfg Corp, Shinchu 300, Taiwan

来源：

DESIGN AND PROCESS INTEGRATION FOR MICROELECTRONIC MANUFACTURING | 2003年

关键词：

test structure; test vehicle; logic process; SoC; electronic design automation; synthesis; migration;

D O I：

10.1117/12.485264

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This work describes a test vehicle design framework, which minimizes the discrepancy among design rule set, test structure design and testing plan. The framework is composed of the symbolic design rule set, Parameterized-Device, test structure generator, and test vehicle generator. An approach for simplification and consolidation of test structure is proposed to derive the concise test structure library. Finally, implementation of test vehicle is presented.

引用

页码：188 / 196

页数：9

共 18 条

[1]

BENSOUIAH DA, 1997, P 40 MIDW S CIRC SYS, V2, P1038

[2] Technology for advanced high-performance microprocessors [J].

Bohr, MT ;

El-Mansy, YA .

IEEE TRANSACTIONS ON ELECTRON DEVICES, 1998, 45 (03) :620-625

[3]

Dessouky M., 2000, Proceedings Design, Automation and Test in Europe Conference and Exhibition 2000 (Cat. No. PR00537), P53, DOI 10.1109/DATE.2000.840015

[4]

DOMIC A, 1990, P DES AUT C, P241

[5]

DOONG KYY, 1999, P INT S SEM MAN ISSM, P241

[6]

DOONG KYY, 2003, IN PRESS P IEEE INT

[7]

Hess C, 2002, ICMTS 2002:PROCEEDINGS OF THE 2002 INTERNATIONAL CONFERENCE ON MICROELECTRONIC TEST STRUCTURES, P189

[8]

KASEL L, 1999, P IEEE INT C MICR TE, P74

[9]

KELVIN YY, 2003, P INT REL PHYS S

[10] A test structure advisor and a coupled, library-based test structure layout and testing environment [J].

Kumar, MV ;

Lukaszek, W ;

Plummer, JD .

IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, 1997, 10 (03) :370-383

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