Studies on aluminum-doped ZnO films for transparent electrode and antireflection coating of β-FeSi2 optoelectronic devices

被引:66
作者
Ootsuka, T
Liu, Z
Osamura, M
Fukuzawa, Y
Kuroda, R
Suzuki, Y
Otogawa, N
Mise, T
Wang, SN
Hoshino, Y
Nakayama, Y
Tanoue, H
Makita, Y
机构
[1] Natl Inst Adv Ind Sci & Technol, AIST, Tsukuba, Ibaraki 3058568, Japan
[2] Syst Engn Co Ltd, AIST Tsukuba W, Dept Technol Dev, Tsukuba, Ibaraki 3058569, Japan
[3] JST Corp, AIST Tsukuba W, Tsukuba, Ibaraki 3058569, Japan
[4] Nippon Inst Technol, Minami Saitamagun, Saitama 3458501, Japan
关键词
beta-FeSi2; zinc oxide; anti reflection coating; transparent electrode; surface; interface;
D O I
10.1016/j.tsf.2004.06.145
中图分类号
T [工业技术];
学科分类号
08 ;
摘要
beta-FeSi2 can be used for various optoelectronic devices owing to its superior material features including high optical absorption coefficient and direct band gap of about 0.8 eV Due to its high refractive index (> 5.6), however, suitable antireflection coating (ARC) is necessary for practical device applications. In order to increase the effective areas of optoelectronic devices, transparent electrodes should be also developed. In this work, Al-doped ZnO (AZO) films were fabricated by sputtering on beta-FeSi2 thin films and were found suitable for both transparent electrodes and ARC films. Choosing optimum substrate temperature and sputtering rate, high quality AZO films were formed. The conductivity of AZO films was as high as 3 x 10(3) S/cm. and ohmic contact was easily achieved between AZO and beta-FeSi2 films, indicating AZO film as an ideal transparent electrode for beta-FeSi2. The transmittance of 400-nm-thick AZO films. was > 80% and > 70% in the wavelength ranges 400-1400 and 1400-1600 nm, respectively. By changing the thickness of AZO film, the central wavelength of minimum reflectance was adjusted to 1550 nm where the total reflectance of AZO/beta-FeSi2/Si structure was reduced below 2%. (c) 2004 Published by Elsevier B.V.
引用
收藏
页码:30 / 34
页数:5
相关论文
共 13 条
  • [1] A CLARIFICATION OF THE INDEX OF REFRACTION OF BETA-IRON DISILICIDE
    BOST, MC
    MAHAN, JE
    [J]. JOURNAL OF APPLIED PHYSICS, 1988, 64 (04) : 2034 - 2037
  • [2] OPTICAL-PROPERTIES OF SEMICONDUCTING IRON DISILICIDE THIN-FILMS
    BOST, MC
    MAHAN, JE
    [J]. JOURNAL OF APPLIED PHYSICS, 1985, 58 (07) : 2696 - 2703
  • [3] Room temperature 1.58 μm photoluminescence and electric properties of highly oriented β-FeSi2 films prepared by magnetron-sputtering deposition
    Chu, SC
    Hirohada, T
    Kan, H
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2002, 41 (3B): : L299 - L301
  • [4] Improved control techniques for the reactive magnetron sputtering of silicon to produce silicon oxide and the implications for selected film properties
    Danson, N
    Hall, GW
    Howson, RP
    [J]. THIN SOLID FILMS, 1996, 289 (1-2) : 99 - 106
  • [5] ELLMER K, 1996, P 25 IEEE PHOT SPEC, P881
  • [6] A silicon/iron-disilicide light-emitting diode operating at a wavelength of 1.5 mu m
    Leong, D
    Harry, M
    Reeson, KJ
    Homewood, KP
    [J]. NATURE, 1997, 387 (6634) : 686 - 688
  • [7] Reduction of iron diffusion in silicon during the epitaxial growth of β-FeSi2 films by use of thin template buffer layers
    Liu, ZX
    Suzuki, Y
    Osamura, M
    Ootsuka, T
    Mise, T
    Kuroda, R
    Tanoue, H
    Makita, Y
    Wang, S
    Fukuzawa, Y
    Otogawa, N
    Nakayama, Y
    [J]. JOURNAL OF APPLIED PHYSICS, 2004, 95 (08) : 4019 - 4024
  • [8] Maeda Y, 2000, MATER RES SOC SYMP P, V607, P315
  • [9] CHARACTERIZATION OF OPTICAL THIN-FILMS
    PULKER, HK
    [J]. APPLIED OPTICS, 1979, 18 (12): : 1969 - 1977
  • [10] Room temperature 1.6 μm electroluminescence from a Si-based light emitting diode with β-FeSi2 active region
    Suemasu, T
    Negishi, Y
    Takakura, K
    Hasegawa, F
    [J]. JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS, 2000, 39 (10B): : L1013 - L1015