Evolution of optical constants of silicon dioxide on silicon from ultrathin films to thick films

A series of SiO2 films with thickness range 1-600 nm have been deposited on crystal silicon (c-Si) substrates by electron beam evaporation (EBE) method. Variable-angle spectroscopic ellipsometry (VASE) in combination with a two-film model (ambient-oxide-interlayer substrate) was used to determine the optical constants and thicknesses of the investigated films. The refractive indices of SiO2 films thicker than 60 nm are close to those of bulk SiO2. For the thin films deposited at the rate of similar to 1.0 nm s(-1), the refractive indices increase with decreasing thickness from similar to 60 to similar to 10 nm and then drop sharply with decreasing thickness below similar to 10 nm. However, for thin films deposited at the rates of similar to 0.4 and similar to 0.2 nm s(-1), the refractive indices monotonically increase with decreasing thickness below 60 nm. The optical constants of the ultrathin film depend on the morphology of the film, the stress exerted on the film, as well as the stoichiometry of the oxide film.