Ellipsometric Studies on Silver Selenide Thin Films

被引:0
作者
Pandiaraman, M. [1 ]
Kumar, C. [2 ]
Soundararajan, N. [1 ]
Ganesan, R. [2 ]
机构
[1] Madurai Kamaraj Univ, Sch Phys, Madurai 625021, Tamil Nadu, India
[2] Indian Inst Sci, Dept Phys, Bangalore 560012, Karnataka, India
来源
SOLID STATE PHYSICS: PROCEEDINGS OF THE 55TH DAE SOLID STATE PHYSICS SYMPOSIUM 2010, PTS A AND B | 2011年 / 1349卷
关键词
Thin films; Band gap; Refractive index; Spectroscopic ellipsometry; AG2SE;
D O I
10.1063/1.3606078
中图分类号
O469 [凝聚态物理学];
学科分类号
070205 ;
摘要
120 nm thick silver selenide thin films were prepared by thermal evaporation technique at a high vacuum better than 2x10(-5)mbar on well cleaned glass substrates at a deposition rate of 0.2 nm/sec. Silver selenide thin films were polycrystalline with orthorhombic structure. Ellipsometric spectra of silver selenide thin films have been recorded in the wavelength range between 300 nm and 700 nm. Optical constants like refractive index, extinction coefficient, absorption coefficient, and optical band gap of silver selenide thin film have been calculated from the recorded spectra. The refractive index of silver selenide has been found to vary between 1.9 and 2.1. The calculated optical band of silver selenide thin film is 1.7 eV.
引用
收藏
页码:755 / +
页数:2
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