A broadband ferromagnetic resonance spectrometer to measure thin films up to 70 GHz

被引：46

作者：

Harward, I. ^{[1
]}

O'Keevan, T. ^{[1
]}

Hutchison, A. ^{[1
]}

Zagorodnii, V. ^{[1
]}

Celinski, Z. ^{[1
]}

机构：

[1] Univ Colorado Colorado Springs, Ctr Magnetism & Magnet Nanostruct, Colorado Springs, CO 80918 USA

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2011年 / 82卷 / 09期

基金：

美国国家科学基金会;

关键词：

coplanar waveguides; ferromagnetic materials; ferromagnetic resonance; spectrometers; LINEWIDTH;

D O I：

10.1063/1.3641319

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report the development of a broadband ferromagnetic resonance (FMR) system operating in the frequency range from 10 MHz to 70 GHz using a closed-cycle He refrigeration system for measurements of thin films and micron/nano structures. The system is capable of carrying out measurements in frequency and field domain. Using two coplanar waveguides, it is capable of simultaneously measuring two samples in the out of plane and in plane FMR geometries. The system operates in the temperature range of 27-350 K and is sensitive to less than one atomic monolayer of a single crystal Fe film. (C) 2011 American Institute of Physics. [doi: 10.1063/1.3641319]

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