Extraction of current signatures for simulation of simultaneous switching noise in high speed digital systems

被引：0

作者：

Mandrekar, R ^{[1
]}

Swaminathan, M ^{[1
]}

Chun, SJ ^{[1
]}

机构：

[1] Georgia Inst Technol, Atlanta, GA 30332 USA

来源：

ELECTRICAL PERFORMANCE OF ELECTRONIC PACKAGING | 2003年

关键词：

D O I：

10.1109/EPEP.2003.1249996

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

This paper describes a measurement based approach for extraction of the current signature to simulate switching noise in complex high speed systems. The approach is tested on a high speed functioning computer system from Sun Microsystems. Using the current source developed, simultaneous switching noise in the core power distribution network of the system has been simulated with good accuracy.

引用

页码：41 / 44

页数：4

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