Use and Benefits of COTS Board Level Testing for Radiation Hardness Assurance

被引：0

作者：

Rousselet, M. ^{[1
]}

Adell, P. C. ^{[2
]}

Sheldon, D. J. ^{[2
]}

Boch, J. ^{[1
]}

Schone, H. ^{[2
]}

Saigne, F. ^{[1
]}

机构：

[1] Univ Montpellier, CNRS, IES UMR UM 5214, 860 Rue St Priest,Bat 5, F-34097 Montpellier, France

[2] CALTECH, Jet Prop Lab, 4800 Oak Grove Dr, Pasadena, CA 91109 USA

来源：

2016 16TH EUROPEAN CONFERENCE ON RADIATION AND ITS EFFECTS ON COMPONENTS AND SYSTEMS (RADECS) | 2016年

关键词：

COTS; ARM; System level; Radiation; TID; TOOL;

D O I：

暂无

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

New Radiation Hardness Assurance (RHA) approaches to insert commercial-of-the-shelf (COTS) electronics into space systems are studied. This study is based on analyses and board level radiation testing of a carefully selected COTS electronic board with a wide range of key commercial components to identify failure modes. A cost-effective qualification approach based on an iterative workflow is proposed. Use and benefits of this method are discussed.

引用

页数：5

共 19 条

[1] Irradiation With Molecular Hydrogen as an Accelerated Total Dose Hardness Assurance Test Method for Bipolar Linear Circuits
Adell, Philippe C.
Pease, Ronald L.
Barnaby, Hugh J.
Rax, Bernard
Chen, Xiao J.
McClure, Steven S.
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2009, 56 (06) : 3326 - 3333
[2] [Anonymous], STRATEGIES FAULT TOL
[3] [Anonymous], AIAA USU C SMALL SAT
[4] [Anonymous], ECSSQST6015C ESAESTE
[5] [Anonymous], MILSTD883 DEP DEF
[6] [Anonymous], P 7 EUR C RADECS
[7] Estimation of low-dose-rate degradation on bipolar linear integrated circuits using switching experiments
Boch, J
Saigné, F
Schrimpf, RD
Vaillé, JR
Dusseau, L
Ducret, S
Bernard, M
Lorfèvre, E
Chatry, C
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2005, 52 (06) : 2616 - 2621
[8] Botma PJ, 2013, AFRICON, P703
[9] Laboratory tests for single-event effects
Buchner, S
McMorrow, D
Melinger, J
Campbell, AB
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 1996, 43 (02) : 678 - 686
[10] Pulsed-laser testing methodology for single event transients in linear devices
Buchner, S
Howard, J
Poivey, C
McMorrow, D
Pease, R
[J]. IEEE TRANSACTIONS ON NUCLEAR SCIENCE, 2004, 51 (06) : 3716 - 3722

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