Critical-path-aware X-filling for effective IR-drop reduction in at-speed scan testing

被引：43

作者：

Wen, Xiaoqing ^{[1
]}

Miyase, Kohei ^{[1
]}

Suzuki, Tatsuya ^{[1
]}

Kajihara, Seiji ^{[1
]}

Ohsumi, Yuji

Saluja, Kewal K.

机构：

[1] Kyushu Inst Technol, Dept CSE, Iizuka, Fukuoka 8208502, Japan

来源：

2007 44TH ACM/IEEE DESIGN AUTOMATION CONFERENCE, VOLS 1 AND 2 | 2007年

关键词：

X-filling; IR-Drop; critical path; test generation; at-speed scan testing; test-induced yield loss;

D O I：

10.1109/DAC.2007.375221

中图分类号：

TP301 [理论、方法];

学科分类号：

081202 ;

摘要：

IR-drop-induced malfunction is mostly caused by timing violations on activated critical paths during the capture cycle of at-speed scan testing. A critical-path-aware X-filling method is proposed for reducing IR-drop, especially on gates that are close to activated critical paths, thus effectively preventing test-induced yield loss.

引用

页码：527 / +

页数：2

共 9 条

[1] A Physical-Location-Aware X-Filling Method for IR-Drop Reduction in At-Speed Scan Test
Hsieh, Wen-Wen
Chen, Shih-Liang
Lin, I-Sheng
Hwang, TingTing
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS, 2010, 29 (02) : 289 - 298
[2] An IR-Drop Aware Test Pattern Generator for Scan-Based At-Speed Testing
Hou, Po-Fan
Lin, Yi-Tsung
Huang, Jiun-Lang
Shih, Ann
Conroy, Zoe F.
2016 IEEE 25TH ASIAN TEST SYMPOSIUM (ATS), 2016, : 167 - 172
[3] Low Capture Switching Activity Test Generation for Reducing IR-Drop in At-Speed Scan Testing
Xiaoqing Wen
Kohei Miyase
Tatsuya Suzuki
Seiji Kajihara
Laung-Terng Wang
Kewal K. Saluja
Kozo Kinoshita
Journal of Electronic Testing, 2008, 24 : 379 - 391
[4] Low capture switching activity test generation for reducing IR-drop in at-speed scan testing
Wen, Xiaoqing
Miyase, Kohei
Suzuki, Tatsuya
Kajihara, Seiji
Wang, Laung-Terng
Saluja, Kewal K.
Kinoshita, Kozo
JOURNAL OF ELECTRONIC TESTING-THEORY AND APPLICATIONS, 2008, 24 (04): : 379 - 391
[5] A GA-Based X-Filling for Reducing Launch Switching Activity toward Specific Objectives in At-Speed Scan Testing
Yamato, Yuta
Wen, Xiaoqing
Miyase, Kohei
Furukawa, Hiroshi
Kajihara, Seiji
IEICE TRANSACTIONS ON INFORMATION AND SYSTEMS, 2011, E94D (04) : 833 - 840
[6] Transient IR-Drop Analysis for At-Speed Testing Using Representative Random Walk
Tsai, Ming-Hong
Ding, Wei-Sheng
Hsieh, Hung-Yi
Li, James Chien-Mo
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2014, 22 (09) : 1980 - 1989
[7] Defect Aware X-Filling for Low-Power Scan Testing
Balatsouka, S.
Tenentes, V.
Kavousianos, X.
Chakrabarty, K.
2010 DESIGN, AUTOMATION & TEST IN EUROPE (DATE 2010), 2010, : 873 - 878
[8] A GA-Based Method for High-Quality X-Filling to Reduce Launch Switching Activity in At-Speed Scan Testing
Yamato, Yuta
Wen, Xiaoqing
Miyase, Kohei
Furukawa, Hiroshi
Kajihara, Seiji
IEEE 15TH PACIFIC RIM INTERNATIONAL SYMPOSIUM ON DEPENDABLE COMPUTING, PROCEEDINGS, 2009, : 81 - 86
[9] A Physical-Location-Aware X-Bit Redistribution for Maximum IR-Drop Reduction
Chen, Fu-Wei
Chen, Shih-Liang
Lin, Yung-Sheng
Hwang, TingTing
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS, 2012, 20 (12) : 2255 - 2264

← 1 →