Optical absorption losses in metal layers used in thin film solar cells

被引：1

作者：

Remes, Zdenek ^{[1
]}

Holovsky, Jakub ^{[1
]}

Purkrt, Adam ^{[1
]}

Izak, Tibor ^{[1
]}

Poruba, Ales ^{[1
]}

Vanecek, Milan ^{[1
]}

Dagkaldiran, Uemit ^{[2
]}

Yates, Heather M. ^{[3
]}

Evans, Philip ^{[3
]}

Sheel, David W. ^{[3
]}

机构：

[1] Acad Sci Czech Republic, Inst Phys, VVI, Prague 16253, Czech Republic

[2] Forschungszentrum Julich, Photovolta IEF5, D-52425 Julich, Germany

[3] Univ Salford, Inst Mat Res, Manchester M5 4WT, Lancs, England

来源：

PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE | 2010年 / 207卷 / 09期

关键词：

dielectric function; optical properties; solar cells; CONSTANTS;

D O I：

10.1002/pssa.200925432

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

We apply optical transmittance and reflectance spectroscopy, photothermal deflection spectroscopy (PDS) and laser calorimetry (LC) to evaluate optical absorption losses at rough interface between thin conductive oxide (TCO) and metal films used as backreflectors and electrical contacts in thin film solar cells. The paper proposes a simple method how to model the dielectric function of rough metal layers used in thin film solar cells. We show that the rough metal layer optically behaves as a semi-infinite layer with modified dielectric function calculated by the Landau-Lifshitz-Looyenga (LLL) model from the dielectric function of a smooth metal, the dielectric function of TCO and just one free parameter that needs to be found by fitting the total optical absorptance. This approach can be used to simplify the modelling of the optical properties of thin film solar cells. (C) 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：2170 / 2173

页数：4

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