Measurements of complex permittivity with waveguide resonator using perturbation technique

An X-band waveguide resonator is used to measure the complex-permittivity of solid-state materials. The measurement technique uses the perturbation technique. The sample is inserted in the waveguide resonator in a cylindrical form. The sample shifts the resonance frequencies. The resonance frequencies and shift frequencies are measured using an HP network analyzer: Thr ee different reference materials ala used to check the accuracy of the measurement technique. The reference materials are: Rexolite, HYD-Cast, and RT / Duroid. A good agreement between the measured dielectric constant and the given values in the literature is observed. The advantage of such a technique is that a very small volume of the sample is needed. (C) 1999 John Wiley & Sons, Inc. Microwave Opt Technol Lett 21: 269-272, 1999.