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Measurement of low-level strain retardation in optical materials
被引：8
作者：
Oakberg, TC
机构：
来源：
POLARIZATION: MEASUREMENT, ANALYSIS, AND REMOTE SENSING
|
1997年
/
3121卷
关键词：
birefringence;
photoelastic modulator;
optical materials;
retardation;
strain;
D O I：
10.1117/12.278974
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ;
080401 ;
081102 ;
摘要：
A method for measurement of low-level strain birefringence in optical elements and materials will be described. This method provides for the simultaneous measurement of magnitude and direction of the net retardation without the necessity of sample rotation. Good agreement was obtained between measured retardation and independent measurements of a polymer waveplate, Measurements were also made of uncalibrated samples with retardation magnitudes down to 1.5 nanometers.
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页码：23 / 27
页数：5
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