Electronic structure of (Pb,La)(Zr,Ti)O3 thin film probed by soft-X-ray spectroscopy

被引：5

作者：

Higuchi, T ^{[1
]}

Tsukamoto, T

Hattori, T

Honda, Y

Yokoyama, S

Funakubo, H

机构：

[1] Tokyo Univ Sci, Dept Appl Phys, Tokyo 1628601, Japan

[2] Tokyo Inst Technol, Dept Innovat & Engn Mat, Yokohama, Kanagawa 2268502, Japan

来源：

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 9B期

关键词：

PZT; PLZT; thin film; X-ray absorption spectroscopy (XAS); soft-X-ray emission spectroscopy (SXES); electronic structure; hybridization effect;

D O I：

10.1143/JJAP.44.6923

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

The electronic structure of (Pb,La)(Zr,Ti)O-3 (PLZT) thin film was studied by X-ray absorption spectroscopy and soft-X-ray emission spectroscopy (SXES). The Ti 3d and O 2p partial densities of states in the valence band region were observed in O 1 s and Ti 2p SXES spectra. The energy position of the Ti 3d state overlapped with that of the O 2p state, indicating the occurrence of the hybridization effect between the Ti 3d and O 2p states. The hybridization effect of PLZT thin film is lower than that of Pb(Zr,Ti)O-3 thin film. This finding indicates that the hybridization effect is closely related to the change in the bond length between Ti and O ions.

引用

页码：6923 / 6926

页数：4

共 29 条

[11] Electronic structure of p-type SrTiO3 by photoemission spectroscopy [J].

Higuchi, T ;

Tsukamoto, T ;

Sata, N ;

Ishigame, M ;

Tezuka, Y ;

Shin, S .

PHYSICAL REVIEW B, 1998, 57 (12) :6978-6983

[12] Electronic structure in the band gap of lightly doped SrTiO3 by high-resolution x-ray absorption spectroscopy [J].

Higuchi, T ;

Tsukamoto, T ;

Kobayashi, K ;

Ishiwata, Y ;

Fujisawa, M ;

Yokoya, T ;

Yamaguchi, S ;

Shin, S .

PHYSICAL REVIEW B, 2000, 61 (19) :12860-12863

[13]

HIGUCHI T, UNPUB

[14]

HONDA Y, 2003, T MAT RES SOC JPN, V28, P157

[15] Si-substituted ultrathin ferroelectric films [J].

Kijima, T ;

Ishiwara, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, 2002, 41 (6B) :L716-L719

[16] Resonant inelastic x-ray scattering spectra for electrons in solids [J].

Kotani, A ;

Shin, S .

REVIEWS OF MODERN PHYSICS, 2001, 73 (01) :203-246

[17] Investigation of PtNb alloy electrodes for ferroelectric Pb(Zr,Ti)O3 thin film capacitors [J].

Kurita, M ;

Okamura, S ;

Shiosaki, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2004, 43 (7A) :4124-4128

[18] Fabrication of ferroelectric Pb(Zr,Ti)O3 thin films by liquid delivery metalorganic chemical vapor deposition [J].

Miyake, M ;

Lee, K ;

Kawasaki, S ;

Ueda, Y ;

Okamura, S ;

Shiosaki, T .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2002, 41 (01) :241-244

[19] Composition control of Pb(ZrxTi1-x)O3 thin films prepared by metalorganic chemical vapor deposition [J].

Nagashima, K ;

Funakubo, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2000, 39 (01) :212-216

[20] Crystal orientation dependence on electrical properties of Pb(Zr,Ti)O3 thick films grown on si substrates by metalorganic chemical vapor deposition [J].

Okamoto, S ;

Yokoyama, S ;

Honda, Y ;

Asano, G ;

Funakubo, H .

JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 2004, 43 (9B) :6567-6570

← 1 2 3 →